Innovation in the Spotlight: HPE Group Takes the Stage at Leading Scientific Conferences

Research and Development have always been a cornerstone of HPE Group’s growth strategy, serving as a powerful engine of innovation and a key driver of skill enhancement across the organization. Through advanced work in power electronics and artificial intelligence—supported by strong partnerships with the Universities of Modena and Reggio Emilia, as well as the University of Bologna— HPE Group continues to access pioneering technologies and expertise.

Advanced R&D at the IEEE Metrology for Automotive Workshop

From June 24 to 26, HPE Group will participate in the IEEE International Metrology for Automotive Workshop in Parma, showcasing breakthroughs that blend innovation and real-world impact.

HPE’s Electrification Division will present a research paper titled:
“Investigation into an NFC-Based Monitoring Sensor Node for Electric Motor: Compression Algorithms for Baud-Rate Constraints.”

The paper introduces a novel compression algorithm (S-LZW) integrated into the rotor of an e-motor. This algorithm enables the real-time transmission of a wider range of data—extending beyond temperature to include vibration and expansion data—directly to an external node. This innovation significantly enhances the predictive maintenance capabilities of electric motors developed by HPE Group, contributing to system longevity and performance optimization.

Keynote on AI in Testing: Smarter Decisions, Better Quality

Also at the IEEE event, HPE specialists Mattia Violi  and Mattia Maffioletti will deliver a keynote presentation titled:
“Artificial Intelligence Supporting End-of-Line Decision-Making: Evolution of Testing Equipment from Measurement Systems to Test Benches.”

The talk will explore how AI is transforming testing workflows by supporting intelligent decision-making throughout the end-of-line process. The AI-driven system enhances three key areas:

• Smart monitoring of measurement system behavior
• Health monitoring of test benches with embedded predictive maintenance
• Automated detection of anomaly root causes

These innovations are already under trial in HPE’s internal testing department, aimed at reducing false measurements, improving quality, and increasing the reliability of test systems.

HPE to Speak at EDGE AI Foundation Conference in Milan

HPE Group’s AI expertise will also take center stage at the EDGE AI Foundation Conference in Milan, an international event focused on embedded systems and machine learning—from TinyML to Generative AI. The conference will be held from July 2–4, featuring a full agenda of workshops and keynotes.

On Thursday, July 3, Mattia Violi, Head of AI at HPE, will present the keynote:
“Thermal Digital Twin of a High-Voltage SiC Inverter Running on StellarE Micro”
The session will explore how thermal digital twins can optimize thermal management and reliability in SiC-based power conversion systems.